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Volume 15; Issue Suppl 2
Main
Microscopy and Microanalysis
Volume 15; Issue Suppl 2
Microscopy and Microanalysis
Volume 15; Issue Suppl 2
1
Electron Energy Loss Spectroscopy of Graphene Identified by Aberration Corrected TEM at 300kV
Abe, Y
,
Tanaka, T
,
Sawada, H
,
Okunishi, E
,
Kondo, Y
,
Takayanagi, K
Journal:
Microscopy and Microanalysis
Year:
2009
Language:
english
File:
PDF, 8.63 MB
Your tags:
english, 2009
2
An integrated Silicon Drift Detector System for FEI Schottky Field
Harrach, H S Von
,
Dona, P
,
Freitag, B.
,
Soltau, H
,
Niculae, a
,
Rohde, M
Journal:
Microscopy and Microanalysis
Year:
2009
Language:
english
File:
PDF, 325 KB
Your tags:
english, 2009
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